New MEMS Accelerometers Enable Early Detection of Structural Defects
Analog Devices MEMS accelerometers perform high resolution vibration measurement with very low noise
Analog Devices, have released a new three-axis, MEMS accelerometers that performs high resolution vibration measurement
with very low noise to enable the early detection of structural defects via wireless sensor networks.
The low power consumption of the new ADXL354 and ADXL355 accelerometers lengthens battery life and
allows extended product usage by reducing the time between battery changes.
The low noise performance of the ADXL354 and ADXL355 with low power consumption makes it now possible to cost-effectively enable low-level vibration measurement applications such as Structural Health Monitoring (SHM). Additionally, the tilt stability of ADXL354 and ADXL355 accelerometers delivers excellent repeatability over temperature and time, which is ideal for orientation and navigation systems in unmanned aerial vehicles using Inertial Measurement Units (IMUs) and inclinometers. By providing repeatable tilt measurement under all conditions, the new accelerometers enable minimal tilt error without extensive calibration in harsh or extreme environments.
With output of ±l2g to ±8g full scale range (FSR), selectable digital filtering from 1 Hz to 1 kHz, and low noise density of 25µ/√Hz at less than 200µA current consumption, the ADXL354 and ADXL355 accelerometers offer performance level comparable to much more expensive devices with less power consumption and BOM cost.
The ADXL354 and ADXL355 accelerometers offer guaranteed temperature stability with null offset coefficients of 0.15mg/C (max). The stability minimizes resource and expense associated with calibration and testing effort, helping to achieve higher throughput for device OEMs. In addition, the hermetic package helps ensure that the end product conforms to its repeatability and stability specifications long after they leave the factory.
Features of the ADXL354, ADXL355 3-Axis MEMS Accelerometer
- Hermetic package offers excellent long-term stability
- 0 g offset vs. temperature (all axes): 0.15 mg/°C maximum
- Low power, VSUPPLY (LDO enabled)
- ADXL354 in measurement mode: 150 µA
- ADXL355 in measurement mode: 200 µA
- ADXL354 and ADXL355 in standby mode: 21 µA
- ADXL355 digital output features
- Digital serial peripheral interface (SPI)/I2C interfaces
- 20-bit analog-to-digital converter (ADC)
- Data interpolation routine for synchronous sampling
- Programmable high- and low-pass digital filters
- ADXL354 adjustable analog bandwidth
- Integrated temperature sensor
- Electromechanical self test
- Voltage range options
- VSUPPLY with internal regulators: 2.25 V to 3.6 V
- V1P8ANA, V1P8DIG with internal low dropout regulator (LDO) bypassed: 1.8 V typical ±10%
- Operating temperature range: −40°C to +125°C
More information on the ADXL355 3-Axis Accelerometer, can be found on the Analog Devices website
Analog Devices ADXL355 product page
The Analog Devices website address is www.analog.com.
[Reprinted with kind permission from Analog Devices - Release Date, 3rd October, 2016]